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NanoGeoscience
* Transmisson Electron Microscope

TEM is one of the basic instruments to study matter at the nanometer scale. In contrast to methods limited to surface characterisation TEM provides detailed information on the structure and chemistry of materials at their basic level.

Specifications

  • PHILIPS CM200
  • Accelerating voltage: 200 kV
  • LaB6 -kathode
  • Twin lens
  • Energy Dispersive Analysis with ultra thin window
  • STEM bright-field/dark-field detectors
  • Gatan multiscan camera
  • Gatan Image Filtering system GIF with EELS spectroscopy

Features

  • conventional electron microscopy (bright-field/dark-field imaging)
  • electron diffraction, convergent beam electron diffraction CBED
  • image analysis
  • chemical analysis (EDAX, EELS)
  • elemental mapping (EDAX, EELS)

Contact
PD Dr. Frank E. Brenker
Tel. 0049-(0)69-798-40134
eMail: eMail


 

 

geändert am 09. April 2009  E-Mail: Webmasterkautz@kristall.uni-frankfurt.de

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Druckversion: 09. April 2009, 08:59
http://www.uni-frankfurt.de/fb/fb11/ifg/mineralogie/nanogeoscience/tem/index.html